Figure 5From: Surface analytical approaches contributing to quality assurance during manufacture of functional interfaces Results of non-destructive surface analysis using Optically Stimulated Electron Emission (OSEE) leading to an OSEE map (topmost image) displaying the local distribution of OSEE signals, and photographic image of the SAE 1008/1010 steel substrate surface. The surface states are as-received and cleaned (on the left side) and ground (on the right side).Back to article page