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Figure 3 | Applied Adhesion Science

Figure 3

From: Pulsed bias effect on roughness of TiO2:Nb films deposited by grid assisted magnetron sputtering

Figure 3

X-ray diffraction pattern of TiO2:Nb films on stainless steel substrate as a function of duty cycle, for -100 V and 100 kHz: Rutile peaks (red) and substrate peaks (black). The plane (101) (green) indicates the presence of anatase. Letters (a), (b), (c) and (d) are index for relating with (Figure 4) and (Table 2). The substrate composition indicated in (a) represents the percentage of each element in mass (in relation to 100%).

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