Fig. 10

Evolution of \({\text{W}}_{{{\text{H}}_{2} {\text{O}}}}\) with increasing thickness t of the oxide layer grown in situ on top of a sample of γ-AlCrFe approximant (see right side of Fig. 3). Observe the decrease of \({\text{W}}_{{{\text{H}}_{2} {\text{O}}}}\) with t increasing up to a value of about 10 nm where \({\text{W}}_{{{\text{H}}_{2} {\text{O}}}}\) shows a marked minimum