Fig. 2From: Study of adhesion between microspheres and rubber surfaces accompanied by meniscus formation and sedimentationAFM measurement of a thin BR film using a cantilever attached to a silica sphere tip. a Force-distance curve of a thin BR film. b Variation in the attractive force with time. Conditions: 500 nm BR film thickness; 10 μm silica sphere diameter; 23.9 N/m cantilever spring constant; 400 nm/s scanning rateBack to article page