Table 3 Results of XPS investigations, with surface concentrations given in atomic % (at%), performed for a dried deposit of GO dispersion (intensively rinsed with water), pristine sapphire, a G50/sapphire film (sample G50-17h), and a GO/G50/sapphire film
Sample | Element | ||||||
|---|---|---|---|---|---|---|---|
F | Mn | O | S | C | N | Al | |
Dried GO dispersion | – | 0.2 ± 0.3 | 22.5 ± 0.4 | 0.1 ± 0.1 | 76.5 ± 0.5 | 0.5 ± 0.1 | – |
Pristine sapphire | 1.0 ± 0.1 | – | 44.2 ± 0.1 | – | 20.5 ± 0.4 | 0.2 ± 0.1 | 33.9 ± 0.1 |
G50/sapphire | 0.3 ± 0.1 | – | 27.0 ± 0.7 | 55.9 ± 2.3 | 0.5 ± 0.1 | 16.0 ± 1.6 | |
GO/G50/sapphire | – | 0.3 ± 0.1 | 30.0 ± 0.4 | 0.6 ± 0.1 | 61.6 ± 0.9 | 0.6 ± 0.1 | 7.3 ± 1.7 |